DocumentCode :
2515125
Title :
EMC challenges and mitigation methodologies for contemporary mobile phones
Author :
Huang, Jingyu
Author_Institution :
Device R&D, Nokia, Beijing Economic & Technol. Dev. Area, Beijing, China
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
44
Lastpage :
47
Abstract :
Challenges in today´s mobile phone design are analyzed, and typical mitigation methodologies that can effectively surmount those challenges are presented.
Keywords :
electromagnetic compatibility; mobile handsets; EMC mitigation; electromagnetic compatibility; mobile phones; Costs; Electromagnetic compatibility; Electromagnetic interference; Electrostatic discharge; Immunity testing; Light emitting diodes; Mobile handsets; RF signals; Radio frequency; Radiofrequency interference;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475748
Filename :
5475748
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2515125
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