• DocumentCode
    2515159
  • Title

    Breaking arc in several liquid environments with light-duty application

  • Author

    Hayakawa, Toshiro ; Sawa, Koichiro

  • Author_Institution
    Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
  • fYear
    1997
  • fDate
    20-22 Oct. 1997
  • Firstpage
    246
  • Lastpage
    253
  • Abstract
    The aim of this work is to study breaking arc phenomena in several liquid environments with light-duty application. The switching tests by using an inductive circuit (load inductance=20 mH, load current=0.5/spl sim/4A) were performed. The steady arc is observed in air under this test condition. The tests were carried out for silver, palladium contacts in several kinds of dielectric liquids such as distilled water, methanol and n-hexane. It was found that arc discharge types were affected by the dielectric constant of liquids as well as the load current. In liquids which have low dielectric constant (n-hexane), the steady arc occurred like in air. On the other hand, in liquids which have high dielectric constant (distilled water and methanol), the steady arc occurred in higher load current ranges, while the showering arc occurred in low load current ranges. Furthermore in this paper, the contact surface and contact resistance are described under the steady and showering arc occurrence conditions.
  • Keywords
    circuit-breaking arcs; contact resistance; dielectric liquids; electrical contacts; 0.5 to 4 A; Ag; Pd; breaking arc; contact resistance; contact surface; dielectric constant; dielectric liquid; distilled water; inductive circuit switching; light duty; load current; load inductance; methanol; n-hexane; palladium contact; showering arc; silver contact; steady arc; Arc discharges; Circuit testing; Dielectric constant; Dielectric liquids; High-K gate dielectrics; Methanol; Palladium; Performance evaluation; Silver; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1997., Proceedings of the Forty-Third IEEE Holm Conference on
  • Conference_Location
    Philadelphia, PA, USA
  • Print_ISBN
    0-7803-3968-1
  • Type

    conf

  • DOI
    10.1109/HOLM.1997.638049
  • Filename
    638049