• DocumentCode
    2515338
  • Title

    Diagnostician-on-a-chip (DOC)

  • Author

    Nolan, Mary ; Granieri, Michael N.

  • Author_Institution
    Giordano Autom. Corp., Sparta, NJ, USA
  • fYear
    1994
  • fDate
    20-22 Sep 1994
  • Firstpage
    409
  • Lastpage
    416
  • Abstract
    This paper describes the principal concepts and initial implementation of an innovative approach for embedding a diagnostic reasoning capability onto microcontroller. The approach is predicated upon the use of an automated concurrent engineering tool set that is utilized to develop a diagnostic knowledge base which is subsequently incorporated into microcontroller´s diagnostic run-time system. Examples of centralized and distributed architectures utilizing the subject approach are described
  • Keywords
    automatic test equipment; computer testing; diagnostic reasoning; distributed processing; fault diagnosis; integrated circuit testing; knowledge based systems; microcontrollers; parallel architectures; real-time systems; Diagnostician-on-a-chip; automated concurrent engineering tool set; built-in diagnostics; centralized architectures; diagnostic knowledge base; diagnostic reasoning capability; diagnostic run-time system; distributed architectures; embedding; microcontroller; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Control systems; Design for testability; Logic testing; Real time systems; Runtime environment; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1910-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1994.381591
  • Filename
    381591