Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis

Author

Deb, Somnath ; Pattipati, Krishna R. ; Raghavan, Vijay ; Shakeri, Mojdeh ; Shrestha, Roshan

Author_Institution

Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA

fYear

1994

fDate

20-22 Sep 1994

Firstpage

361

Lastpage

373

Abstract

In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting

Keywords

automatic test software; design for testability; failure analysis; fault diagnosis; signal flow graphs; DFT; TEAMS software package; cassette player; cause-effect dependency modeling; fault diagnosis; feedback loop analysis; hierarchical system schematics; hierarchical troubleshooting; modular diagnosis; multi-signal flow graph; static fault analysis; system integration; system testability analysis; test sequencing algorithm; Costs; Design automation; Design for testability; Design optimization; Fault diagnosis; Flow graphs; Maintenance engineering; Manufacturing; Observability; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.

Conference_Location

Anaheim, CA

Print_ISBN

0-7803-1910-9

Type

conf

DOI

10.1109/AUTEST.1994.381596

Filename

381596