Title :
Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis
Author :
Deb, Somnath ; Pattipati, Krishna R. ; Raghavan, Vijay ; Shakeri, Mojdeh ; Shrestha, Roshan
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
Abstract :
In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting
Keywords :
automatic test software; design for testability; failure analysis; fault diagnosis; signal flow graphs; DFT; TEAMS software package; cassette player; cause-effect dependency modeling; fault diagnosis; feedback loop analysis; hierarchical system schematics; hierarchical troubleshooting; modular diagnosis; multi-signal flow graph; static fault analysis; system integration; system testability analysis; test sequencing algorithm; Costs; Design automation; Design for testability; Design optimization; Fault diagnosis; Flow graphs; Maintenance engineering; Manufacturing; Observability; System testing;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381596