Title :
Bit Cell Aspect Ratio: An SNR And Detection Perspective
Author :
Arnoldussen, T.C.
Author_Institution :
IBM Corp.
Keywords :
Eigenvalues and eigenfunctions; Noise level; Signal to noise ratio; Space vector pulse width modulation; Thermal stability; Timing jitter; Voltage;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742627
