DocumentCode
2515568
Title
The problem of mismanagement of test information
Author
Heiser, John E. ; Hinkle, Gary L.
Author_Institution
JEH Consulting Inc., Monument, CO, USA
fYear
1994
fDate
20-22 Sep 1994
Firstpage
301
Lastpage
306
Abstract
Electronics testing is accomplished to identify components that have prevented an electronic assembly from performing as designed. This paper identifies the information related obstacles traditionally encountered in this process and points to the ABBET component standards that have been and are being introduced to enable new paradigms to dramatically improve the test information process
Keywords
automatic test equipment; economics; electronic equipment testing; software development management; standardisation; ABBET component standards; electronic assembly; electronics testing; mismanagement; test information; test information process; Assembly; Banking; Cable TV; Electronic equipment testing; Information analysis; Instruments; Noise figure; Noise measurement; Packaging; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1910-9
Type
conf
DOI
10.1109/AUTEST.1994.381605
Filename
381605
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