Title :
The problem of mismanagement of test information
Author :
Heiser, John E. ; Hinkle, Gary L.
Author_Institution :
JEH Consulting Inc., Monument, CO, USA
Abstract :
Electronics testing is accomplished to identify components that have prevented an electronic assembly from performing as designed. This paper identifies the information related obstacles traditionally encountered in this process and points to the ABBET component standards that have been and are being introduced to enable new paradigms to dramatically improve the test information process
Keywords :
automatic test equipment; economics; electronic equipment testing; software development management; standardisation; ABBET component standards; electronic assembly; electronics testing; mismanagement; test information; test information process; Assembly; Banking; Cable TV; Electronic equipment testing; Information analysis; Instruments; Noise figure; Noise measurement; Packaging; Performance evaluation;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381605
