Title :
TRSL standard supports current and future test processes
Author :
Atkins, Richard ; Rolince, Dave
Author_Institution :
Honeywell Technol. Center, Minneapolis, MN, USA
Abstract :
Standards must have economic relevance to be successful and must be provided to users in a form that supports real-world application. The Test Requirements Specification Language (IEEE P1029.3 TRSL and EIA EDIF-Test) seeks to reduce the costs and time associated with test development by providing the ability to create formal, computer-processable specifications of products, test requirements and test methods, and construct libraries of reusable test knowledge. Reuse can significantly reduce costs in well-understood application domains, but requires commercial tools and methods to provide these benefits to users. ProgramGuide from Teradyne is one such fool that seeks to reduce the costs associated with test development for digital products by providing a state-of-the-art methodology, supported by automation, that leads the user through an efficient test development process. TRSL can augment this environment in key areas by providing the ability to encode and reuse test information as a natural aspect of following the methodology. TRSL also provides the ability to enhance this methodology to increase cost benefits even further, by supporting integrated reuse of design and test information. TRSL, coupled with commercial tools and methods, can enhance the current test process as well as provide a foundation for developing improved processes
Keywords :
IEEE standards; automatic test software; economics; electronic equipment testing; software reusability; EIA EDIF-Test; IEEE P1029.3 TRSL; ProgramGuide; TRSL standard; Teradyne; Test Requirements Specification Language; computer-processable specifications; costs; integrated reuse; software reuse; test information reuse; Automatic control; Automatic testing; Character generation; Costs; Displays; Electronic equipment testing; Software libraries; Software testing; System testing; USA Councils;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381608