Title :
Bulk current injection testing of close proximity cable current return, 1 kHz to 1 MHz
Author :
Bradley, Arthur T. ; Lee, William M. ; Singh, Vivek ; Yavoich, Brian
Author_Institution :
NASA Langley Res. Center, Hampton, VA, USA
Abstract :
This paper presents the results of an experiment examining the percentage of current that returns on adjacent wires or through a surrounding cable shield rather than through a shared conducting chassis. Simulation and measurement data are compared from 1 kHz - 1 MHz for seven common cable configurations. The phenomenon is important to understand, because minimizing the return current path is vital in developing systems with low radiated emissions.
Keywords :
cable shielding; electric current measurement; electromagnetic compatibility; adjacent wire; bulk current injection testing; cable shield; close proximity cable current return; frequency 0.001 MHz; frequency 1 MHz; low radiated emission; return current path; Cable shielding; Circuits; Coaxial components; Conductors; Crosstalk; Electromagnetic compatibility; Inductance; Power distribution; Testing; Wire;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475777