DocumentCode
2515623
Title
Bulk current injection testing of close proximity cable current return, 1 kHz to 1 MHz
Author
Bradley, Arthur T. ; Lee, William M. ; Singh, Vivek ; Yavoich, Brian
Author_Institution
NASA Langley Res. Center, Hampton, VA, USA
fYear
2010
fDate
12-16 April 2010
Firstpage
305
Lastpage
308
Abstract
This paper presents the results of an experiment examining the percentage of current that returns on adjacent wires or through a surrounding cable shield rather than through a shared conducting chassis. Simulation and measurement data are compared from 1 kHz - 1 MHz for seven common cable configurations. The phenomenon is important to understand, because minimizing the return current path is vital in developing systems with low radiated emissions.
Keywords
cable shielding; electric current measurement; electromagnetic compatibility; adjacent wire; bulk current injection testing; cable shield; close proximity cable current return; frequency 0.001 MHz; frequency 1 MHz; low radiated emission; return current path; Cable shielding; Circuits; Coaxial components; Conductors; Crosstalk; Electromagnetic compatibility; Inductance; Power distribution; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475777
Filename
5475777
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