Title :
Reducing capacity and conflict misses using Set Saturation Levels
Author :
Rolán, Dyer ; Fraguela, Basilio B. ; Doallo, Ramón
Author_Institution :
Dept. de Electron. e Sist., Univ. da Coruna, A Coruña, Spain
Abstract :
The well-known memory wall problem has motivated wide research in the design of caches. Last-level caches, whose misses can stall the processors for hundreds of cycles, have received particular attention. Strategies to modify adaptably the cache insertion, promotion, eviction and even placement policies have been proposed, some techniques being better at reducing different kinds of misses. For example changes in the placement policy of a cache, which are a natural option to reduce conflict misses, can do little to fight capacity misses, which depend on the relation between the working set of the application and the cache size. Nevertheless, other techniques such as the recently proposed dynamic insertion policy (DIP), whose aim is to retain a fraction of the working set in the cache when it is larger than the cache size, attack primarily capacity misses. In this paper we present a coordinated strategy to reduce both capacity and conflict misses by changing the placement and insertion policies of the cache. Our strategy takes its decisions based on the concept of the Set Saturation Level (SSL), which tries to measure to which degree a set can hold its working set. Despite requiring only less than 1% storage overhead, our proposal, called Bimodal Set Balancing Cache, reduced the average miss rate of a baseline 2MB 8-way second level cache by 16%, which translated into an average IPC improvement of 4.8% in our experiments.
Keywords :
cache storage; memory architecture; DIP; SSL; bimodal set balancing cache; cache design; capacity miss reduction; conflict miss reduction; dynamic insertion policy; last-level cache; memory wall problem; set saturation level; Benchmark testing; Electronics packaging; Hardware; Measurement; Program processors; Proposals; Radiation detectors; Cache; adaptivity; balancing; insertion; performance; replacement; set saturation level; thrashing;
Conference_Titel :
High Performance Computing (HiPC), 2010 International Conference on
Conference_Location :
Dona Paula
Print_ISBN :
978-1-4244-8518-5
Electronic_ISBN :
978-1-4244-8519-2
DOI :
10.1109/HIPC.2010.5713184