• DocumentCode
    251572
  • Title

    Resistance calibration method without external precision elements

  • Author

    Melikyan, Vazgen ; Sahakyan, Arthur ; Piloyan, Mikayel ; Hovhannisyan, Gagik ; Shishmanyan, Aram ; Hovhannisyan, Taron ; Trdatyan, Davit

  • Author_Institution
    Dept. of Microelectron. Circuits & Syst., State Eng. Univ. of Armenia, Yerevan, Armenia
  • fYear
    2014
  • fDate
    26-29 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A method of resistance calibration without external precision elements usage presented in paper. In the proposed method, used structures which operation based on technologically accurate elements and signals to have high accuracy resistance after calibration. Architecture produces a calibration code corresponding to 50Ohms PVT compensated termination impedance, which is needed to avoid reflections in transmission lines. Standard calibration methods using external ~1% accuracy precision discreet resistance (50 or 200Ohms). The presented calibration mechanism using internal elements and can provide ~ 4-7% accuracy of calibration. Method can be used in the special input/output circuits of several standards such as Peripheral Component Interconnect (PCI), Universal Serial Bus (USB), Double Data Rate (DDR) etc.
  • Keywords
    calibration; electric resistance measurement; transmission lines; DDR; PCI; PVT compensated termination impedance; USB; accuracy precision discreet resistance; calibration code; double data rate; external precision element; peripheral component interconnect; process voltage and temperature; resistance 50 ohm; resistance calibration method; technologically accurate element; transmission line; universal serial bus; Accuracy; Calibration; Capacitors; Receivers; Reflection; Resistance; Resistors; comparator (COMP); compensation; multiplexor (MUX); precision; process, voltage and temperature (PVT); receiver (RX); reflection; resistance calibration; termination; transmitter (TX);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (EWDTS), 2014 East-West
  • Conference_Location
    Kiev
  • Type

    conf

  • DOI
    10.1109/EWDTS.2014.7027071
  • Filename
    7027071