• DocumentCode
    2515721
  • Title

    Development of lightning electromagnetic impulse simulator on buildings

  • Author

    Uchida, Hajime ; Mori, Yoshiaki ; Kobayashi, Nobusato ; Yanai, Shinji ; Endo, Tetsuo ; Takahashi, Yuichi ; Yonezawa, Kaname ; Idogawa, Teruo ; Sato, Masaaki ; Higashi, Shuji

  • Author_Institution
    M&E Eng. Design Div., Taisei Corp., Tokyo, Japan
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1205
  • Lastpage
    1208
  • Abstract
    In this paper, we report the development of lightning electromagnetic impulse simulator on buildings. This simulator is linked with the counting code VSTL (Virtual Surge Test Lab.) based on the FDTD (Finite Difference Time Domain) method being developed by Central Research Institute of Electric Power Industry. We can analyze the current, voltage and electromagnetic field intensity of buildings which were quantified on real time at the direct stroke on the building lightning rod. With this analysis, a proper layout plan of important rooms in buildings has successfully been performed, and the optimum lightning Surge Protection Device (SPD) can be selected. And we made experiments to validate this simulator using a building scale model. This model was built on 1/4 scale of a building.
  • Keywords
    electrical engineering computing; electromagnetic interference; finite difference time-domain analysis; lightning protection; surge protection; FDTD; buildings; counting code VSTL; electromagnetic field intensity; finite difference time domain method; lightning electromagnetic impulse; lightning rod; lightning surge protection device; virtual surge test laboratory; Electromagnetic analysis; Electromagnetic fields; Finite difference methods; Lightning; Performance analysis; Surge protection; Surges; Testing; Time domain analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475784
  • Filename
    5475784