Title :
Self-testing checker design for incomplete m-out-of-n codes
Author_Institution :
Tomsk State Univ., Tomsk, Russia
Abstract :
This paper presents the synthesis of self-testing checker (STC) for a subset of l codewords of m-out-of-n code. We consider FPGA realization of the checker.
Keywords :
codes; field programmable gate arrays; logic design; logic testing; FPGA realization; STC; codewords; incomplete m-out-of-n codes; self-testing checker design; Built-in self-test; Circuit faults; Computers; Educational institutions; Field programmable gate arrays; Single event upsets;
Conference_Titel :
Design & Test Symposium (EWDTS), 2014 East-West
Conference_Location :
Kiev
DOI :
10.1109/EWDTS.2014.7027072
