Title :
Performance-limiting Defects in CdZnTe Detectors
Author :
Bolotnikov, A.E. ; Camarda, G.S. ; Carini, G. ; Cui, Y. ; Kohman, K.T. ; Li, L. ; Salomon, M.B. ; James, R.B.
Author_Institution :
Brookhaven Nat. Lab., Upton, NY
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
We studied the effects of small, <20 mum, Te inclusions on the energy resolution of CdZnTe gamma-ray detectors using a highly collimated X-ray beam and gamma-rays, and modeled them via a simplified geometrical approach. Previous reports demonstrated that Te inclusions of about a few microns in diameter degraded the charge-transport properties and uniformity of CdZnTe detectors. The goal of this work was to understand the extent to which randomly distributed Te-rich inclusions affect the energy resolution of CZT detectors, and to define new steps to overcome their deleterious effects. We used a phenomenological model, which depends on several adjustable parameters, to reproduce the experimentally measured effects of inclusions on energy resolution. We also were able to bound the materials-related problem and predict the enhancement in performance expected by reducing the size and number of Te inclusions within the crystals.
Keywords :
II-VI semiconductors; cadmium compounds; gamma-ray detection; inclusions; semiconductor counters; transport processes; CdZnTe; CdZnTe gamma-ray detectors; Te inclusions; charge transport properties; energy resolution; highly collimated X-ray beam; highly collimated gamma-rays; performance-limiting defects; Charge measurement; Crystals; Current measurement; Degradation; Electron beams; Energy resolution; Gamma ray detectors; Spatial resolution; Tellurium; X-ray detection; CdZnTe; Te inclusions; semiconductor detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.353780