High-Performance, Large-Volume THM CdZnTe Detectors for Medical Imaging and Homeland Security Applications

Author

Chen, Henry ; Awadalla, Salah A. ; Redden, Robert ; Bindley, Glenn ; Bolotnikov, A.E. ; Camarda, G.S. ; Carini, G. ; James, R.B.

Author_Institution

Redlen Technol., Sidney, BC

Volume

6

fYear

2006

fDate

Oct. 29 2006-Nov. 1 2006

Firstpage

3629

Lastpage

3637

Abstract

High-quality large single crystals of Cd_0.9Zn_0.1Te (> 7 inch³) have been consistently produced by the THM (solution growth) method. Various large-volume X-ray and gamma-ray detector configurations fabricated from this THM CZT material have produced detectors with excellent performance. A room-temperature mean energy resolution of 4.3% for a Co-57 source (122 keV) and uniform pixel-to-pixel response have been demonstrated on monolithic 20times20times5 mm³ pixellated detectors useful for imaging applications. In addition, energy resolution of <1% FWHM @ Cs-137 (662 keV) has been measured on virtual Frisch-Grid 4times4times11 mm³ devices useful for homeland security applications. Additional characterization techniques such as mu-tau measurements, infrared microscopy, X-ray topography and ODLTS have demonstrated the superior quality of this THM CZT. The results of material characterization measurements and detector tests will be presented.

Keywords

II-VI semiconductors; biomedical imaging; cadmium compounds; crystal growth from solution; gamma-ray detection; national security; semiconductor counters; Cd_0.9Zn_0.1Te; ODLTS; THM; X-ray detector; X-ray topography; biomedical imaging; crystal growth from solution; gamma-ray detector; homeland security application; infrared microscopy; large-volume CdZnTe detector; mean energy resolution; mu-tau measurement; pixellated detectors; virtual Frisch-Grid devices; Biomedical imaging; Crystalline materials; Crystals; Energy resolution; Gamma ray detectors; Pixel; Tellurium; Terrorism; X-ray imaging; Zinc;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium Conference Record, 2006. IEEE

Conference_Location

San Diego, CA

ISSN

1095-7863

Print_ISBN

1-4244-0560-2

Electronic_ISBN

1095-7863

Type

conf

DOI

10.1109/NSSMIC.2006.353781

Filename

4179823