• DocumentCode
    2515951
  • Title

    Some consideration of voltage-induced interfacial space charge in several laminated dielectrics

  • Author

    Tanaka, Toshikatsu ; Uchiumi, Michihiro

  • Author_Institution
    Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
  • fYear
    1998
  • fDate
    22-25 Jun 1998
  • Firstpage
    23
  • Lastpage
    27
  • Abstract
    Some theoretical consideration is given for voltage-induced interfacial space charge in several laminated dielectrics which was measured by the laser induced pressure pulse (LIPP) method and the pulsed electroacoustic (PEA) method. A low density polyethylene sheet was laminated by several kinds of materials such as ethylene vinyl acetate, ethylene propylene copolymers, ethylene propylene-diene terpolymers with the diene components of dicyclospentadiene and ethylenepropylene diene terpolymers with 5-ethylidene-2-norbornene. Interfacial space charge formed in such dielectrics by application of dc voltage and its decay process are evaluated and analyzed in term of permittivity and electrical conductivity of the materials used. Two or three decay time constants are obtained for each of the laminates and are correlated with the electrical and dielectric properties of the dielectrics used
  • Keywords
    composite insulating materials; electrical conductivity; laminates; permittivity; polyethylene insulation; space charge; 5-ethylidene-2-norbornene; decay time; dicyclospentadiene; electrical conductivity; ethylene propylene copolymer; ethylene propylene diene terpolymer; ethylene vinyl acetate; laminated dielectric; laser induced pressure pulse method; low density polyethylene sheet; permittivity; pulsed electroacoustic method; voltage-induced interfacial space charge; Charge measurement; Conducting materials; Current measurement; Dielectric materials; Dielectric measurements; Optical pulses; Pulse measurements; Pulsed electroacoustic methods; Space charge; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
  • Conference_Location
    Vasteras
  • Print_ISBN
    0-7803-4237-2
  • Type

    conf

  • DOI
    10.1109/ICSD.1998.709218
  • Filename
    709218