DocumentCode
2515969
Title
Computer aided partial discharge evaluation about the surface material of the PD-source in gas-insulated substations
Author
Kranz, H.-G. ; Krump, R.
Author_Institution
Lab. fur Hochspannungstech., Bergische Univ., Gesamthochschule Wuppertal, West Germany
fYear
1988
fDate
5-8 June 1988
Firstpage
246
Lastpage
249
Abstract
A PD (partial-discharge) diagnosis system is presented that gives information about the location of any detectable PD source in a GIS (gas-insulated-substation) testing unit. For every detected impulse the system measures and processes the apparent charge, impulse duration, phase angle, test voltage V/sub pp/, actual test voltage, impulse energy, and cycle number. A high-speed (60-MHz bandwidth) electronic system has been developed for online measuring and digital conversion. The data are transmitted to a personal computer by means of an electro-fiber-optic interface unit and analyzed by a statistical algorithm. This procedure runs automatically and provides information about the surface materials on which the partial discharges are active. Two types of defects representing sources of partial discharging have been implemented in gas-insulated switchgear. Some of the results are presented and discussed, showing the potential of computer-aided partial discharge evaluation.<>
Keywords
gaseous insulation; partial discharges; switchgear testing; switching substations; GIS; apparent charge; computer-aided partial discharge evaluation; cycle number; electro-fiber-optic interface unit; gas-insulated substations; gas-insulated switchgear; impulse duration; impulse energy; online measuring; partial discharge evaluation; phase angle; statistical algorithm; surface material; test voltage; Charge measurement; Current measurement; Energy measurement; Geographic Information Systems; Impulse testing; Partial discharges; Phase detection; Surface discharges; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on
Conference_Location
Cambridge, MA, USA
ISSN
1089-084X
Type
conf
DOI
10.1109/ELINSL.1988.13915
Filename
13915
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