DocumentCode
2515979
Title
Type Conversion of Polycrystalline CdZnTe Thick Films by Multiple Compensation
Author
Kim, K.H. ; Won, J.H. ; Cho, S.H. ; Suh, J.H. ; Hong, J.K. ; Kim, S.U.
Author_Institution
Div. of Med. Sensor, Samil-Pharm, Seoul
Volume
6
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
3643
Lastpage
3646
Abstract
Semi-insulating n-type polycrystalline CdZnTe thick films are deposited by thermal evaporation method. The solubility of Cl in CdZnTe limits high doping concentration that establish full compensation. To make the most use of merit of Cl, heavy metals (Pb, Sn) are co-doped in CdZnTe. The electrical and optical properties of Pb and Sn co-doped with Cl are characterized by IV, PL and TOF measurement. Depends on the doping concentration of Pb or Sn, there was drastic changes in resistivity and conductivity type. In semi-insulating polycrystalline CdZnTe thick films, the A-center level that is found in compensated material, did not found. The electron mobility is about 88 cm2/Vs and for the first time the gamma ray spectrum of 241Am was detected using polycrystalline CdZnTe thick films.
Keywords
II-VI semiconductors; cadmium compounds; electrical conductivity; electrical resistivity; electron mobility; gamma-ray spectra; semiconductor counters; semiconductor doping; thick films; A-center level; X-ray detector; conductivity type conversion; doping concentration; electrical properties; electrical resistivity; electron mobility; gamma ray spectrum; lead; multiple compensation; n-type semiconductors; optical properties; polycrystalline CdZnTe thick films; semiinsulating polycrystalline thick film; thermal evaporation method; tin; Conducting materials; Conductivity; Doping; Electric variables measurement; Electron mobility; Gamma ray detection; Optical films; Optical materials; Thick films; Tin; X-ray detector; lead; multiple compensation; polycrystalline CdZnTe; semi-insulating; thick films; tin; type conversion;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.353783
Filename
4179825
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