DocumentCode :
2516007
Title :
Analysis of platform noise effect on WWAN performance
Author :
Lin, Han-Nien ; Lin, Ching-Hsien ; Chang, Ming-Cheng ; Shih, Yu-Yang
Author_Institution :
Dept. of Commun. Eng., Feng-Chia Univ., Taichung, Taiwan
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
719
Lastpage :
722
Abstract :
With the advance of semiconductor and wireless communications technologies in recent years, the systems of highly integrated high-speed digital circuits and multi-radio modules have paved the way to mobile communications and networking. While notebook computers become more and more powerful in all respects, many RF modules such as Wi-Fi, Bluetooth, WWAN with GSM and WCDMA have been put together inside notebook computer to enhance mobile communications. The system design becomes more difficult due to the design complexity and stringent requirement for platform noise. Since the in-bands EMI emitted from CPU, LCD, memory and CCD camera will degrade the wireless communication performance and even severely affect the project development, we have to take into account of platform noise problem during the system design and integration stage. In order to study the effect of digital platform noise on the receiving performance of wireless communications, we use the popular Netbook to evaluate its TIS (Total Isotropic Sensitivity) following OTA test procedure of CTIA. From the measurement result, we found that when the noise level increases 1 dB, the receiving sensitivity degrades 2 dB accordingly. Therefore we will further analyze the relationship between TIS and the platform noise from different devices in this paper.
Keywords :
cellular radio; digital circuits; electromagnetic interference; notebook computers; wide area networks; Bluetooth; CCD camera; GSM; Netbook; OTA test; RF modules; WCDMA; WWAN; Wi-Fi; design complexity; digital platform noise effect analysis; highly integrated high-speed digital circuits; in-band EMI; mobile communications; multiradio modules; notebook computers; total isotropic sensitivity; wireless communications technology; Bluetooth; Communications technology; Degradation; Digital circuits; Integrated circuit technology; Mobile communication; Performance analysis; Radio frequency; Semiconductor device noise; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475800
Filename :
5475800
Link To Document :
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