DocumentCode
251611
Title
Selftest ADCs for smart sensors
Author
Krutchinsky, Sergei G. ; Zhebrun, Evgeniy A.
Author_Institution
Sci. Center “MicAn”, Southern Fed. Univ., Rostov-on-Don, Russia
fYear
2014
fDate
26-29 Sept. 2014
Firstpage
1
Lastpage
4
Abstract
A procedure for testing the pulse-potential ADC, aimed at minimizing the analog sections zero drift impact on input signal conversion accuracy is proposed. The procedure is based on the basic properties of the ADC - quantization of energy. It is shown that introduced testing phases allows to determine the binary words that are corrective in common additive sequence of measured quantity calculation and not increasing its sensitivity. Parametric conditions for the method applicability that justifies the need of support circuit design tasks solutions are formulated.
Keywords
analogue-digital conversion; automatic testing; intelligent sensors; binary words; common additive sequence; energy quantization; input signal conversion accuracy; parametric conditions; pulse-potential testing; quantity calculation; selftest ADC; smart sensors; support circuit design tasks solutions; Accuracy; Phase measurement; Pulse measurements; Semiconductor device measurement; System-on-chip; Testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium (EWDTS), 2014 East-West
Conference_Location
Kiev
Type
conf
DOI
10.1109/EWDTS.2014.7027093
Filename
7027093
Link To Document