Title :
Selftest ADCs for smart sensors
Author :
Krutchinsky, Sergei G. ; Zhebrun, Evgeniy A.
Author_Institution :
Sci. Center “MicAn”, Southern Fed. Univ., Rostov-on-Don, Russia
Abstract :
A procedure for testing the pulse-potential ADC, aimed at minimizing the analog sections zero drift impact on input signal conversion accuracy is proposed. The procedure is based on the basic properties of the ADC - quantization of energy. It is shown that introduced testing phases allows to determine the binary words that are corrective in common additive sequence of measured quantity calculation and not increasing its sensitivity. Parametric conditions for the method applicability that justifies the need of support circuit design tasks solutions are formulated.
Keywords :
analogue-digital conversion; automatic testing; intelligent sensors; binary words; common additive sequence; energy quantization; input signal conversion accuracy; parametric conditions; pulse-potential testing; quantity calculation; selftest ADC; smart sensors; support circuit design tasks solutions; Accuracy; Phase measurement; Pulse measurements; Semiconductor device measurement; System-on-chip; Testing; Voltage measurement;
Conference_Titel :
Design & Test Symposium (EWDTS), 2014 East-West
Conference_Location :
Kiev
DOI :
10.1109/EWDTS.2014.7027093