• DocumentCode
    2516180
  • Title

    Optimization of multislotted rectangular microstrip patch antenna using ANN and bacterial foraging optimization

  • Author

    Kumar, K. Arun ; Ashwath, R. ; Kumar, D. Sriram ; Malmathanraj, R.

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol., Tiruchirapalli, India
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    “In this paper, the design of multi-slot microstrip antenna on a substrate of 2 mm thickness was considered. The IE3D software which is based on method of moments(MOM) was used to determine the simulated results of return loss, resonant frequency, radiation pattern and gain. Artificial Neural Network (ANN) was also developed to calculate the parameters of the antenna. The experimental results were taken in the frequency band of 6 GHz to 12 GHz. The simulated results from IE3D were compared with results obtained from ANN methods such as GRNN, SVM and the results were in good agreement. A new method of using Bacteria Foraging Optimization (BFO) to calculate the resonant frequency was discussed. The results obtained were very much accurate in comparison with simulated results”.
  • Keywords
    antenna radiation patterns; electrical engineering computing; method of moments; microstrip antennas; neural nets; optimisation; slot antennas; IE3D software; artificial neural network; bacterial foraging optimization; frequency 6 GHz to 12 GHz; method of moments; multislotted rectangular microstrip patch antenna; radiation pattern; resonant frequency; return loss; Artificial neural networks; Bandwidth; Design optimization; Microorganisms; Microstrip antennas; Microwave antennas; Optimization methods; Patch antennas; Probes; Resonant frequency; Artificial Neural Networks; BFO; GRNN; Multislotted Rectangular Microstrip Patch Antenna; SVM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475810
  • Filename
    5475810