DocumentCode
2516212
Title
CdTe detector characteristics around 30°C when using the periodic bias reset technique
Author
Seino, Tomoyuki ; Takahashi, Isao
Author_Institution
Power & Ind. Syst. R & D Lab., Hitachi, Ltd., Hitachi
Volume
6
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
3687
Lastpage
3690
Abstract
Pulse heights of the CdTe detector photopeaks were lowered in several ten minutes due to the polarization effect around 30degC. In this paper, the CdTe detector characteristics were evaluated at 30degC and 35degC, and the periodic bias reset technique was investigated as a way to stabilize the detector performance. The 500 V bias with 0.5 s to 60s reset durations and 1 min to 20 min reset intervals was applied to 1 mm thick CdTe detectors. It was found that the 0.5 s reset duration and 5 min reset interval was able to stabilize the detector performance at 35degC.
Keywords
cadmium compounds; gamma-ray detection; polarisation; readout electronics; semiconductor counters; CdTe; CdTe detector; detector performance stability; detector photopeaks; periodic bias reset technique; polarization effect; pulse heights; reset duration; reset intervals; Diodes; Energy resolution; Gamma ray detection; Gamma ray detectors; Laboratories; Nuclear medicine; Polarization; Pulse amplifiers; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.353793
Filename
4179835
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