• DocumentCode
    2516212
  • Title

    CdTe detector characteristics around 30°C when using the periodic bias reset technique

  • Author

    Seino, Tomoyuki ; Takahashi, Isao

  • Author_Institution
    Power & Ind. Syst. R & D Lab., Hitachi, Ltd., Hitachi
  • Volume
    6
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    3687
  • Lastpage
    3690
  • Abstract
    Pulse heights of the CdTe detector photopeaks were lowered in several ten minutes due to the polarization effect around 30degC. In this paper, the CdTe detector characteristics were evaluated at 30degC and 35degC, and the periodic bias reset technique was investigated as a way to stabilize the detector performance. The 500 V bias with 0.5 s to 60s reset durations and 1 min to 20 min reset intervals was applied to 1 mm thick CdTe detectors. It was found that the 0.5 s reset duration and 5 min reset interval was able to stabilize the detector performance at 35degC.
  • Keywords
    cadmium compounds; gamma-ray detection; polarisation; readout electronics; semiconductor counters; CdTe; CdTe detector; detector performance stability; detector photopeaks; periodic bias reset technique; polarization effect; pulse heights; reset duration; reset intervals; Diodes; Energy resolution; Gamma ray detection; Gamma ray detectors; Laboratories; Nuclear medicine; Polarization; Pulse amplifiers; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.353793
  • Filename
    4179835