DocumentCode :
2516212
Title :
CdTe detector characteristics around 30°C when using the periodic bias reset technique
Author :
Seino, Tomoyuki ; Takahashi, Isao
Author_Institution :
Power & Ind. Syst. R & D Lab., Hitachi, Ltd., Hitachi
Volume :
6
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
3687
Lastpage :
3690
Abstract :
Pulse heights of the CdTe detector photopeaks were lowered in several ten minutes due to the polarization effect around 30degC. In this paper, the CdTe detector characteristics were evaluated at 30degC and 35degC, and the periodic bias reset technique was investigated as a way to stabilize the detector performance. The 500 V bias with 0.5 s to 60s reset durations and 1 min to 20 min reset intervals was applied to 1 mm thick CdTe detectors. It was found that the 0.5 s reset duration and 5 min reset interval was able to stabilize the detector performance at 35degC.
Keywords :
cadmium compounds; gamma-ray detection; polarisation; readout electronics; semiconductor counters; CdTe; CdTe detector; detector performance stability; detector photopeaks; periodic bias reset technique; polarization effect; pulse heights; reset duration; reset intervals; Diodes; Energy resolution; Gamma ray detection; Gamma ray detectors; Laboratories; Nuclear medicine; Polarization; Pulse amplifiers; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.353793
Filename :
4179835
Link To Document :
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