• DocumentCode
    2516241
  • Title

    The Effects of Traffic Patterns on Power Consumption of Torus-Connected NoCs with Faults

  • Author

    Safaei, F. ; Shantia, A.H. ; Khonsari, A. ; Ould-Khaoua, M.

  • Author_Institution
    Sch. of Comput. Sci., IPM, Tehran, Iran
  • fYear
    2009
  • fDate
    25-27 Sept. 2009
  • Firstpage
    627
  • Lastpage
    632
  • Abstract
    High performance, reliability, transient and permanent fault-tolerance, and low energy consumption are major objectives of Networks-on-Chip (NoCs). Since,different applications impose various communication requirements in NoCs, a number of research studies have revealed that the performance advantages of routing schemes are more noticeable on power consumption under different traffic patterns. However,the power consumption issues of NoCs have not been thoroughly investigated in the presence of faulty regions. To the best of our knowledge, this research is the first attempt to examine the effects of most popular traffic patterns (i.e., Uniform, Local, and Hot-Spot) on power consumption of NoCs in the presence of permanent faults.
  • Keywords
    computer network performance evaluation; fault tolerance; network-on-chip; power aware computing; telecommunication traffic; Torus connected NoCs power consumption; faulty regions; low energy consumption; networks-on-chip; performance analysis; permanent fault tolerance; reliability; traffic pattern; traffic patterns effect; transient fault tolerance; Communication switching; Computer networks; Delay; Embedded computing; Energy consumption; Fault tolerance; High performance computing; Network-on-a-chip; Routing; Telecommunication traffic; Adaptive routing; Fault-Tolerance; NoC; Performance evaluation; Power consumption; Software-based routing; Virtual channels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Scalable Computing and Communications; Eighth International Conference on Embedded Computing, 2009. SCALCOM-EMBEDDEDCOM'09. International Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    978-0-7695-3825-9
  • Type

    conf

  • DOI
    10.1109/EmbeddedCom-ScalCom.2009.120
  • Filename
    5341884