• DocumentCode
    2516257
  • Title

    Development of mathematical relation between ESDD and wind velocity for a contaminated insulator in Malaysia

  • Author

    Salam, Md Abdus ; Ahmad, Hussein ; Fuad, Syed Ahmad ; Ahmad, Ahmad S. ; Tamsir, Tarmidi ; Piah, M.A.M. ; Buntat, Z. ; Saadom, Zulkifly ; Budin, Razali

  • Author_Institution
    Fac. of Electr. Eng., Univ. Teknologi Malaysia, Malaysia
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    379
  • Abstract
    Insulator contamination has been identified as the most important design parameter for external insulation of the high voltage network systems. Wind and electrostatic field plays an important role in transporting and depositing of that contamination over the insulator surface. This contamination severity on the insulator surface can be expressed and represented by Equivalent Salt Deposit Density (ESDD). The values of ESDD can be determined easily through a closed form of mathematical relation. In this paper, a mathematical relation between ESDD, wind velocity and leakage distance of the insulator has been proposed using Dimensional Analysis technique. The results obtained from this analytical expression have been compared with the practical data, which are collected from the Paka Thermal Power Station and good agreement are observed at lower wind velocity
  • Keywords
    insulator contamination; ESDD; Malaysia; Paka Thermal Power Station; dimensional analysis; electrostatic field; equivalent salt deposit density; high voltage network system; insulator contamination; leakage distance; outdoor insulation; wind velocity; Dielectrics and electrical insulation; Electrostatics; Marine pollution; Ocean temperature; Power generation; Sea measurements; Sea surface; Surface contamination; Voltage; Wind speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5459-1
  • Type

    conf

  • DOI
    10.1109/ICPADM.2000.875709
  • Filename
    875709