DocumentCode :
2516708
Title :
Optimizing burst erasure correction of LDPC codes by interleaving
Author :
Sridharan, Gokul ; Kumarasubramanian, Abishek ; Thangaraj, Andrew ; Bhashyam, Srikrishna
Author_Institution :
Electr. Eng. Dept., Indian Inst. of Technol. Madras, Chennai
fYear :
2008
fDate :
6-11 July 2008
Firstpage :
1143
Lastpage :
1147
Abstract :
The performance of iterative decoding of low density parity check (LDPC) codes over binary erasure channels can be completely characterized by the study of stopping sets. Therefore, the burst erasure correction capability of a given LDPC code can be readily quantified by searching for stopping sets within consecutive bit nodes. In this work we study the optimal permutation of the bit nodes that will result in the maximum possible burst erasure correction capability for a given LDPC code. Noting that this is essentially a combinatorial optimization problem that is highly likely to be NP-hard, we adopt a simulated annealing based approach for finding the optimal permutation. We present bounds based on stopping sets that limit the burst erasure correction capability. As part of our results, we provide interleavers that greatly improve the burst erasure correction capability of protograph quasi-cyclic LDPC codes used in the WiMax standard.
Keywords :
WiMax; cyclic codes; error correction codes; iterative decoding; parity check codes; simulated annealing; LDPC codes; WiMax standard; burst erasure correction optimization; combinatorial optimization problem; iterative decoding; low density parity check codes; optimal permutation; quasi-cyclic codes; simulated annealing based approach; Code standards; Computational modeling; Error correction codes; Interference; Interleaved codes; Iterative algorithms; Iterative decoding; Parity check codes; Simulated annealing; WiMAX;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
Type :
conf
DOI :
10.1109/ISIT.2008.4595166
Filename :
4595166
Link To Document :
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