• DocumentCode
    2516727
  • Title

    Applications of Monte Carlo Methods to Simulate Gamma Ray Interactions in Si and Ge

  • Author

    Campbell, Luke ; Gao, Fei ; Devanathan, Ram ; Xie, YuLong ; Peurrung, Anthony J. ; Webber, William J.

  • Author_Institution
    Pacific Northwest Nat. Lab., Richland, WA
  • Volume
    6
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    3805
  • Lastpage
    3808
  • Abstract
    A Monte Carlo code is employed to simulate the electron cascade subsequent to a gamma ray interaction in two common semiconductors, silicon and germanium, over the energy range of 50 eV to 2 MeV. The partitioning of the gamma ray energy into the various loss mechanisms determines the performance of the detector, generally parameterized by the average energy to create a charge carrier pair, W, and the intrinsic variance or Fano factor, F. In this work, W and F are found as a function of energy, exhibiting saw-toothed variation at the shell edges and a well defined high energy value well above the K edge. Our calculated results are in agreement with experiment Valence to conduction interband transitions and plasmon excitations are the dominant source of electron-hole pairs.
  • Keywords
    Monte Carlo methods; gamma-ray detection; gamma-ray effects; germanium radiation detectors; silicon radiation detectors; 50 to 2E6 eV; Fano factor; Monte Carlo method; Valence-conduction interband transition; charge carrier pair; electron cascade; electron-hole pair; energy loss mechanism; gamma ray interaction; germanium detectors; plasmon excitation; semiconductor detectors; silicon detectors; Charge carriers; Electrons; Energy resolution; Laboratories; Monte Carlo methods; Optical scattering; Oscillators; Particle scattering; Production; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.353821
  • Filename
    4179863