• DocumentCode
    2516885
  • Title

    Eutectic solder flip chip technology for chip scale package

  • Author

    Takubo, Chiaki ; Hirano, Naohiko ; Doi, Kazuhide ; Tazawa, Hiroshi ; Hosomi, Eiichi ; Hiruta, Yoichi

  • Author_Institution
    Semicond. Adv. Packaging Eng. Dept., Toshiba Corp., Yokohama, Japan
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    488
  • Lastpage
    493
  • Abstract
    Chip Scale Package (CSP) has been developed by applying the flip chip technology with the eutectic Sn/Pb solder bumps. The package size is only 1 mm larger than the chip size. The eutectic solder has advantages such as a good wettability to the electrodes, a strong self-alignment effect and a low melting point. So, it is quite suitable for a chip assembly onto the plastic substrate as well as the ceramic substrate. An electroplating method has been developed for the formation of the eutectic solder bumps. The barrier metals has been selected as Ti/Ni/Pd for higher barrier effect. The flip chip interconnection process has been also developed. The various kinds of the reliability of the interconnection portion were investigated using the test vehicle of the ceramic and plastic substrate. The results of the test confirmed the reliable fabrication of the CSP using the eutectic solder flip chip technology
  • Keywords
    electroplating; eutectic alloys; flip-chip devices; lead alloys; packaging; soldering; tin alloys; CSP fabrication; Sn-Pb; Ti-Ni-Pd; barrier metal; ceramic substrate; chip scale package; electroplating; eutectic solder bump; flip chip technology; interconnection reliability; melting point; plastic substrate; self-alignment; wettability; Assembly; Ceramics; Chip scale packaging; Electrodes; Fabrication; Flip chip; Plastics; Testing; Tin; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559794
  • Filename
    559794