DocumentCode :
2516943
Title :
A Study of Gain Stability and Charging Effects in GEM Foils
Author :
Azmoun, B. ; Anderson, W. ; Crary, D. ; Durham, J. ; Hemmick, T. ; Kamin, J. ; Karagiorgi, G. ; Kearney, K. ; Keeler, G. ; Kornacki, E. ; Lynch, P. ; Majka, R. ; Rumore, M. ; Simon, F. ; Sinsheimer, J. ; Smirnov, N. ; Surrow, B. ; Woody, C.
Author_Institution :
Dept. of Phys., Brookhaven Nat. Lab., Upton, NY
Volume :
6
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
3847
Lastpage :
3851
Abstract :
A study has been carried out to investigate the gain stability and charging effects in Gas Electron Multipliers (GEMs). It was found that the gain of a GEM typically rises after the initial application of high voltage across the foil, but the degree and rate of rise can depend on a variety of different factors. These factors include the geometry of the foil (inner and outer hole diameter), the rate of ionizing radiation applied to the foil, the amount of water content of the operating gas, and possibly various other factors related to the manufacturing process. We have studied GEMs produced by several different manufacturers and compared their gain behavior as a function of time, after applying and removing the high voltage, gain as a function of rate, and the degree of initial charge up as a function of water content in the gas. While GEMs from all manufacturers exhibited an initial charge up to some degree, there was a large variation in this effect between different foils. The ratio of inner to outer hole diameter and the amount of water content in the gas seem to be two principle factors affecting the degree and rate of the initial charge up effect observed in certain foils.
Keywords :
electron multiplier detectors; foils; ionisation chambers; GEM foils; GEM manufacture; Gas Electron Multipliers; charging effects; foil geometry; gain stability; high voltage; hole diameter; ionizing radiation; water content; Copper; Detectors; Dielectrics; Electrodes; Manufacturing; Nuclear and plasma sciences; Physics; Polyimides; Stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.353830
Filename :
4179872
Link To Document :
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