• DocumentCode
    2516984
  • Title

    The relationship between electrical characteristics and electrical tree degradation in XLPE insulation

  • Author

    Kang, D.S. ; Sun, J.H. ; Lee, H.S.

  • Author_Institution
    Korea Electrotechnol. Res. Inst., Changwon, South Korea
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    546
  • Abstract
    In order to improve the reliability of XLPE cables, the acquisition of the fittest diagnostic parameters by analyzing the trend of its electrical properties is inevitable. The present study was carried out to evaluate the change of electrical properties of XLPE cable insulation with electrical tree degradation and the relationship between electrical properties (PD quantity, tan δ and DC current) and the growth length of electrical tree measured by the real-time monitoring system was investigated. The partial discharge magnitude was proportional to tree length at 10 and 12 kV among the applied voltages, and the dielectric loss angle was considered as a practical criterion for showing the condition just before breakdown. However, it was difficult to reveal any correlation between DC leakage current and electrical degradation
  • Keywords
    XLPE insulation; dielectric losses; leakage currents; power cable insulation; trees (electrical); DC current; DC leakage current; XLPE insulation; cable insulation; cable reliability; dielectric loss angle; electrical degradation; electrical tree degradation; partial discharge; real-time monitoring system; tan δ; tree growth length; Breakdown voltage; Cable insulation; Current measurement; Degradation; Dielectric losses; Dielectric measurements; Dielectrics and electrical insulation; Electric variables; Partial discharges; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    0-7803-5459-1
  • Type

    conf

  • DOI
    10.1109/ICPADM.2000.875752
  • Filename
    875752