DocumentCode :
2517020
Title :
Detective Quantum Efficiency and Deadtime Losses in Compton Imaging Systems
Author :
Nurdan, K. ; Çonka-Nurdan, T. ; Walenta, A.H. ; Brill, A.B.
Author_Institution :
Dept. of Phys., Siegen Univ.
Volume :
6
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
3880
Lastpage :
3883
Abstract :
The Compton camera is an imaging system where the vertex and the angle of the scattered gamma ray are reconstructed by measuring in coincidence the Compton electron and the scattered gamma ray. If one of the detectors has a modest time resolution a hardwired coincidence unit will lead to unsatisfying results at elevated rates. Therefore new concept of a software based coincidence system systems has been developed. This allows to record most events and to use additional information to solve possible ambiguities. The key elements are time stamps added to all signals and to process data in a first unit in order to rearrange the signals to good events. Monte Carlo simulations have been carried out in order to assess the effects of detector dead time and dead time introduced by these necessary processing stages. It could be shown that the new data acquisition system behaves as if at high rates it is limited by an equivalent paralysable deadtime, which then translates to a rate dependent detective quantum efficiency (DQE). More detailed studies show that the time duration for the processing of an event in the processor of the system and the event buffer depth are controlling factors. This is important for system design to optimize the DQE for real time high data rate applications. Specifically, Monte-Carlo (MC) simulations are performed for highly efficient thick Si(Li) detectors where event reconstruction is compromised by the long drift times of the order of microseconds. Time stamping and realtime processing of complex event information remedies the drift problem which is demonstrated with the developed concept of DQE and equivalent time coincidence window width.
Keywords :
Monte Carlo methods; coincidence techniques; lithium; silicon; silicon radiation detectors; Compton camera; Compton imaging systems; Monte Carlo simulations; Si(Li); coincidence systems; data acquisition system; deadtime losses; detective quantum efficiency; detector dead time; equivalent time coincidence window width; time stamping; Cameras; Data acquisition; Detectors; Electrons; Image reconstruction; Optical imaging; Particle scattering; Signal processing; Signal resolution; Software systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.353836
Filename :
4179878
Link To Document :
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