DocumentCode :
2517640
Title :
FDTD calculation of lightning-induced voltages on an overhead two-wire distribution line
Author :
Takeshima, Toshiki ; Baba, Yoshihiro ; Nagaoka, Naoto ; Ametani, Akihiro ; Takami, Jun ; Okabe, Shigemitsu ; Rakov, Vladimir A.
Author_Institution :
Doshisha Univ., Kyoto, Japan
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
1317
Lastpage :
1320
Abstract :
We have calculated lightning-induced voltages on a 680-m long overhead two-wire line using the finite-difference time-domain (FDTD) method for solving Maxwell´s equations. The FDTD method employed here uses a three-dimensional nonuniform grid, which is fine (cell side length is 0.875 m) in the vicinity of overhead wires and coarse (maximum cell side length is 7 m) in the rest of the space. The overhead wires having radii of several millimetres are simulated by placing a wire having an equivalent radius of about 0.2 m (≈ 0.23 × 0.875 m) in the center of an artificial rectangular prism having a cross-sectional area of (2 × 0.875 m) × (2 × 0.875 m) and the modified electrical constants: low permittivity and high permeability. The induced-voltage waveform, calculated for the condition that the return-stroke wavefront speed is 130 m/μs, the ground conductivity is 3.5 mS/m, and the grounding resistance ranges from 30 to 75 Ω, agrees well with the corresponding waveform measured by Barker et al. in a rocket-triggered lightning experiment.
Keywords :
finite difference time-domain analysis; lightning protection; permeability; permittivity; power grids; power overhead lines; FDTD calculation; finite-difference time-domain method; ground conductivity; induced-voltage waveform; lightning protection; lightning-induced voltages; overhead two-wire distribution line; permeability; permittivity; three-dimensional nonuniform grid; Conductivity; Electric resistance; Finite difference methods; Grounding; Maxwell equations; Permeability; Permittivity; Time domain analysis; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475892
Filename :
5475892
Link To Document :
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