• DocumentCode
    2518230
  • Title

    Infrared pulsed laser deposition of yttrium doped BSCCO superconducting films

  • Author

    De Vero, Jeffrey C. ; Blanca, Glaiza Rose S ; Vitug, Jaziel R. ; Garcia, Wilson O. ; Sarmago, Roland V.

  • Author_Institution
    Nat. Inst. of Phys., Univ. of the Philippines, Quezon City, Philippines
  • fYear
    2010
  • fDate
    3-6 Dec. 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    High Tc superconducting Bi2Sr2Ca1-xYxCu2O8+δ (Bi-22Y2) with 0.25≤x≤0.49 were deposited on MgO (100) by infrared (1064 nm) pulsed laser deposition with subsequent heat treatments. As- deposited films were partially melted and subsequently annealed in ambient air. The as-deposited films exhibit spheriodal morphology but maintain the stoichiometry of the target. After heat treatments steps, relatively smooth and flat films were achieved. Grain boundaries become more apparent at higher yttrium doping. The films are highly c-axis oriented. The zero resistance temperature Tc increases from 85 K to 90.5 K but drop with additional Y until 87 K. The highest critical current density obtained is 723.14 A/cm2 at 70 K for 28% Y-doped sample under zero field.
  • Keywords
    bismuth compounds; calcium compounds; critical current density (superconductivity); grain boundaries; heat treatment; high-temperature superconductors; laser materials processing; melting; pulsed laser deposition; strontium compounds; superconducting materials; yttrium; BSCCO:Y; MgO; annealing; critical current density; grain boundaries; heat treatments; infrared pulsed laser deposition; melting; spheriodal morphology; stoichiometry; yttrium doped BSCCO superconducting; zero resistance temperature; Doping; Films; Heat treatment; Pulsed laser deposition; Substrates; Yttrium; BSCCO; pulsed laser deposition; superconductor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-8393-8
  • Electronic_ISBN
    978-1-4244-8392-1
  • Type

    conf

  • DOI
    10.1109/AOM.2010.5713508
  • Filename
    5713508