Title :
Fiber length and chromatic dispersion measurement technology using a novel optical frequency domain reflectometry
Author :
Wang, Binhao ; Yan, Guofeng ; Yan, Chunsheng
Author_Institution :
State Key Lab. for Modern Opt. Instrum., Zhejiang Univ., Hangzhou, China
Abstract :
We have proposed and demonstrated a novel optical frequency domain reflectometry (OFDR) incorporating an electron-optic modulator (EOM) for fiber length and chromatic dispersion measurement. The fiber length and chromatic information can be obtained by analyzing the phase difference of two interference beams in frequency domain. Two reflection points with a distance of 7 m at the end of the fiber under test (FUT) 60 km away was well distinguished and the chromatic dispersion is successfully measured at C-band.
Keywords :
Sagnac interferometers; electro-optical modulation; length measurement; light reflection; optical fibre dispersion; optical fibre testing; reflectometry; OFDR; chromatic dispersion measurement; distance 60 km; distance 7 m; electron-optic modulator; fiber length; optical frequency domain reflectometry; phase difference; Optical fiber dispersion; Optical fiber sensors; Optical fibers; Optical interferometry; Optical reflection; Sagnac interferometer; chromatic dispersion; electro-optic modulator (EOM); fiber length; optical frequency domain reflectometry (OFDR);
Conference_Titel :
Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4244-8393-8
Electronic_ISBN :
978-1-4244-8392-1
DOI :
10.1109/AOM.2010.5713515
