DocumentCode :
2518383
Title :
SiGe BiCMOS CSA-shaper radiation detection front end: Noise performance and noise modelling
Author :
Noulis, T. ; Kaiserlis, N. ; Siskos, S. ; Sarrabayrouse, G.
Author_Institution :
Electron. Lab. of Phys. Dept., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
fYear :
2010
fDate :
26-28 April 2010
Firstpage :
896
Lastpage :
901
Abstract :
A detailed comparison of four equivalent charge-sensitive, folded-cascode amplifiers in terms of noise performance is presented. A couple of complementary structures, one with a noise-optimised input nMOSFET and the other with a noise-optimised input pMOSFET were designed in 0.35 μm CMOS process by Austria MicroSystems (AMS). Another couple of complementary structures consisting of a noise-optimised input NPN with a pMOSFET cascode, and the respective structure having a pMOS as input device, were developed in a 0.35 μm SiGe BiCMOS process (AMS). The structures´ comparison is performed through simulation, after careful selection of the parameters that remain constant in all four variations -extended analysis regarding SiGe BiCMOS radiation detection folded cascode based Charge pre-amplifiers is presented and selection criteria are suggested in relation to the detector capacitance value. In addition, NPN HBT noise modelling analysis is also performed in order to extract conclusions about the related noise sources and to investigate the capability for extra noise reduction.
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; MOSFET circuits; heterojunction bipolar transistors; integrated circuit modelling; integrated circuit noise; preamplifiers; radiation detection; semiconductor materials; Austria MicroSystems; BiCMOS CSA-shaper radiation detection; CMOS process; NPN HBT noise modelling analysis; SiGe; charge preamplifiers; charge sensitive amplifiers; detector capacitance; folded-cascode amplifiers; noise-optimised input MOSFET; pMOSFET cascode; size 0.35 mum; Analytical models; BiCMOS integrated circuits; CMOS process; Germanium silicon alloys; MOSFET circuits; Noise reduction; Performance analysis; Radiation detectors; Semiconductor device modeling; Silicon germanium; Radiation detection frond ends; SiGe BiCMOS; noise performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
Conference_Location :
Valletta
Print_ISBN :
978-1-4244-5793-9
Type :
conf
DOI :
10.1109/MELCON.2010.5475937
Filename :
5475937
Link To Document :
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