DocumentCode
2518405
Title
Introduction and overview of artificial neural networks in instrumentation and measurement applications
Author
Hudson, William B.
Author_Institution
Dept. of Electr. & Comput. Eng., Kansas State Univ., Manhattan, KS, USA
fYear
1993
fDate
18-20 May 1993
Firstpage
623
Lastpage
626
Abstract
The author describes some neural network implementations as well as provides readers with basic artificial neural network theory and references to allow them to explore the applicability of neural network technologies for their specific applications. Ideas presented allow inclusion of neural network computational strategies in instrumentation and measurement applications. The terminology and training methods are outlined
Keywords
computerised instrumentation; learning (artificial intelligence); neural nets; artificial neural networks; computational strategies; instrumentation; measurement applications; theory; training; Analog computers; Application software; Artificial neural networks; Computer networks; Dielectric measurements; Electric variables measurement; Instrumentation and measurement; Intelligent networks; Spirals; Turing machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location
Irvine, CA
Print_ISBN
0-7803-1229-5
Type
conf
DOI
10.1109/IMTC.1993.382568
Filename
382568
Link To Document