• DocumentCode
    2518469
  • Title

    Brute Force Vulnerability Testing Technology Based on Data Mutation

  • Author

    Gu, Shijia ; Li, Weihai ; Zhao, Xin

  • Author_Institution
    Sch. of Electron. Eng., Beijing Univ. of Posts & Telecommun., Beijing, China
  • fYear
    2011
  • fDate
    5-8 Sept. 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Protocol plays a profound role among networked computers in security issues. With the development of computer network engineering, protocol has become increasingly intricate in both data format and interaction behavior, which means that more potential defects exist in protocol software implementations. These factors make protocol vulnerable to malicious attacks and raise the security requirements to an ever high level. After over ten-year progress, however, the vulnerability testing methods have not been unified to an agreement. Especially, the problems in automated test cases generation remain to be solved. This paper proposes a novel brute force vulnerability testing technique, generating test data by mutating captured protocol messages. And to formalize the perturbing process, regular expression is introduced into the approach for constructing test case templates. In addition, a multi-protocol test tool called PVD is developed to implement the test system architecture. Finally, the authors carry on a complete vulnerability testing campaign on Asterisk 1.4 SIP (Session Initiation Protocol) server, as the result, finding a number of protocol defects and achieving fairly efficient test results.
  • Keywords
    computer network security; signalling protocols; Asterisk 1.4 SIP; brute force vulnerability testing technology; computer network engineering; data mutation; malicious attacks; networked computers; protocol software implementations; security issues; session initiation protocol server; test system architecture; Generators; Internet; Protocols; Security; Servers; Syntactics; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference (VTC Fall), 2011 IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    1090-3038
  • Print_ISBN
    978-1-4244-8328-0
  • Type

    conf

  • DOI
    10.1109/VETECF.2011.6092833
  • Filename
    6092833