DocumentCode
2518547
Title
CONFORMAL CONTOUR MAPPING FOR NEUROSURGERY OUTCOME EVALUATION
Author
Wu, Danqing ; Liu, Chang ; Zou, Guangyu ; Hua, Jing ; Muzik, Otto
Author_Institution
Dept. of Comput. Sci., Wayne State Univ., Detroit, MI
fYear
2007
fDate
12-15 April 2007
Firstpage
21
Lastpage
24
Abstract
Contour mapping of surgical resection of cortex is very important in neurosurgery outcome evaluation. Based on advanced MR and PET imaging technologies and our landmark-constrained brain conformal mapping, we present a practical and accurate approach to map the resection contour on the cortical surface from post-surgery brain images to presurgery ones. The approach can accommodate and combat the possible changes of the brain in shape and size over time. To free the user from manually defining the resection contours, we propose an automatic identification algorithm based on dynamic region growing on the cortical surface. We also present an effective method to calculate the area of the region enclosed by the resection contour on the cortical surface. The overall framework provides surgeons an accurate assessment of the agreement between functional PET abnormalities and the extent of surgical resection
Keywords
biomedical MRI; biomedical measurement; brain; medical image processing; neurophysiology; positron emission tomography; shape measurement; surface topography measurement; surgery; automatic identification algorithm; conformal contour mapping; cortex; cortical surface; functional PET abnormalities; image matching; image registration; landmark-constrained brain conformal mapping; magnetic resonance imaging; neurosurgery; neurosurgery outcome evaluation; positron emission tomography imaging; post-surgery brain images; presurgery images; resection contour; surgical resection; Biomedical imaging; Brain mapping; Computer science; Conformal mapping; Geometry; Image registration; Neurosurgery; Positron emission tomography; Shape; Surgery;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2007. ISBI 2007. 4th IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
1-4244-0672-2
Electronic_ISBN
1-4244-0672-2
Type
conf
DOI
10.1109/ISBI.2007.356778
Filename
4193212
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