Title :
STATISTICALLY-CONSTRAINED DEFORMABLE REGISTRATION OF MR BRAIN IMAGES
Author :
Xue, Zhong ; Shen, Dinggang
Author_Institution :
Dept. of Radiol., Pennsylvania Univ., Philadelphia, PA
Abstract :
Statistical models of deformations (SMD) capture the variability of deformations of a group of sample images, and they are often used to constrain deformable registration, thereby improving their robustness and accuracy. Although low-dimensional statistical models, such as active shape and appearance models, have been successfully used in statistically-constrained deformable models, constraining of high-dimensional warping algorithms is a more challenging task, since conventional PCA-based statistics are limited to capture the full range of anatomical variability. This paper first proposes an SMD that is built upon the wavelet-PCA model and then uses it to constrain the deformable registration, wherein the template image is adaptively warped based on SMD during the registration procedure. Compared to the original template image, the adaptively deformed template image is more similar to the subject image, e.g., the deformation is relatively small and local, and it is less likely to be stuck in undesired local minima. In experiments, we show that the proposed statistically-constrained deformable registration is more robust and accurate than the conventional registration
Keywords :
biomedical MRI; brain models; deformation; image registration; medical image processing; statistical analysis; wavelet transforms; active shape model; adaptively warped image; anatomical variability; appearance model; brain images; deformable registration; deformations; deformed template image; high-dimensional warping algorithms; image registration; magnetic resonance images; statistical constraint; statistical models; wavelet-PCA model; Active shape model; Brain; Deformable models; Image registration; Jacobian matrices; Principal component analysis; Robustness; Statistical distributions; Statistics; Wavelet packets;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2007. ISBI 2007. 4th IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0672-2
Electronic_ISBN :
1-4244-0672-2
DOI :
10.1109/ISBI.2007.356779