Title :
Array codes for clustered column erasures
Author :
Cassuto, Yuval ; Bruck, Jehoshua
Author_Institution :
Hitachi Global Storage Technol., San Jose, CA
Abstract :
A new error model is proposed for codes over channels with memory. According to this error model, both the number of symbol errors and the number of error clusters are used to characterize permissible errors. Considering this model as a generalization of random erasures in array codes naturally captures the properties of high-order failure events in disk arrays. A new family of codes tailored to such a model is shown to provide significant complexity improvements compared to known array codes.
Keywords :
channel coding; array codes; clustered column erasures; error clusters; high-order failure events; symbol errors; Cooling; Decoding; Error correction; Error correction codes; Hamming distance; Mechanical cables; Memoryless systems; Postal services; Power supplies; Redundancy;
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
DOI :
10.1109/ISIT.2008.4595283
