• DocumentCode
    2518673
  • Title

    Mechanical Reliability Evaluation of Sn-37Pb/Cu and Sn-37Pb/ENIG Solder Joints by using High Speed Lap-shear Test

  • Author

    Jeon, Seong-jae ; Hyun, Seungmin ; Lee, Hak-Joo ; Kim, Jong-woong ; Jung, Seung-Boo ; Lee, Hoo-Jeong

  • Author_Institution
    Sch. of Adv. Mater. Sci. & Eng., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    516
  • Lastpage
    520
  • Abstract
    This study utilized out high speed lap-shear tests at various strain rates (0.01 mm/s ~ 500 mm/s) for Sn-37Pb/Cu and Sn-37Pb/ENIG solder joints to evaluate the drop reliability. The samples aged for 120 h at different temperatures (150°C and 170°C) were also tested to examine the effects of aging on the drop reliability. We thoroughly analyzed the stress-strain curves obtained from the lap-shear tests and the fractured surfaces. This analysis generated insightful information that reveals three fracture surface types active in our samples. This study also elucidates different fracture mode for the Sn-37Pb/Cu and Sn-37Pb/ENIG solder joints. This study successfully demonstrates that the analysis based on a high speed lap-shear test could be critically used to evaluate the drop reliability of solder joints.
  • Keywords
    ageing; ball grid arrays; copper; fracture; gold; lead alloys; mechanical testing; nickel; reliability; solders; stress-strain relations; tin alloys; Sn-37Pb-Cu solder joint; Sn-37Pb-ENIG solder joint; SnPb-Cu; SnPb-Ni-Au; aging; ball grid array solder; drop reliability; fracture mode; fracture surface; high speed lap-shear test; mechanical reliability; strain rate; stress-strain curves; temperature 150 degC; temperature 170 degC; time 120 h; Aging; Capacitive sensors; Chip scale packaging; Joining materials; Materials reliability; Materials testing; Soldering; Surface cracks; System testing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763485
  • Filename
    4763485