• DocumentCode
    2518721
  • Title

    Error-correcting codes for rank modulation

  • Author

    Jiang, Anxiao Andrew ; Schwartz, Moshe ; Bruck, Jehoshua

  • Author_Institution
    Comput. Sci. Dept., Texas A&M Univ., College Station, TX
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    1736
  • Lastpage
    1740
  • Abstract
    We investigate error-correcting codes for a novel storage technology for flash memories, the rank-modulation scheme. In this scheme, a set of n cells stores information in the permutation induced by the different charge levels of the individual cells. The resulting scheme eliminates the need for discrete cell levels, overcomes overshoot errors when programming cells (a serious problem that reduces the writing speed), and mitigates the problem of asymmetric errors. In this paper, we study the properties of error correction in rank modulation codes. We show that the adjacency graph of permutations is a subgraph of a multi-dimensional array of a special size, a property that enables code designs based on Lee- metric codes. We present a one-error-correcting code whose size is at least half of the optimal size. We also present additional error-correcting codes and some related bounds.
  • Keywords
    error correction codes; flash memories; graph theory; modulation; Lee-metric codes; adjacency graph; asymmetric errors; error-correcting codes; flash memories; overshoot errors; permutation; rank modulation; storage technology; Computer errors; Computer science; Current measurement; Electron traps; Error correction codes; Flash memory; Modulation coding; Nonvolatile memory; Robustness; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595285
  • Filename
    4595285