Title :
Nondestructive microwave measurements of dielectric materials
Author :
Ganchev, Stoyan I.
Author_Institution :
Hewlett-Packard Co., Colorado Springs, CO, USA
Abstract :
Nondestructive microwave dielectric measurements based on open-ended rectangular waveguide and coaxial line sensors are considered. The errors in the dielectric constant measurements due to the uncertainties of the measuring instruments are calculated and compared for the two types of sensors. A comparison based on advantages and disadvantages for both sensors is also presented
Keywords :
dielectric measurement; microwave measurement; nondestructive testing; rectangular waveguides; coaxial line sensors; dielectric constant measurements; dielectric materials; dielectric measurements; measuring instruments; nondestructive microwave measurements; open-ended rectangular waveguide; Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Dielectric substrates; Dielectric thin films; Measurement techniques; Measurement uncertainty; Microwave measurements; Reflection;
Conference_Titel :
Microwaves and Radar, 1998. MIKON '98., 12th International Conference on
Conference_Location :
Krakow
Print_ISBN :
83-906662-0-0
DOI :
10.1109/MIKON.1998.742804
