Title :
System approach to electrical measurements
Author_Institution :
Dept. di´ingenierie, Univ. du Quebec a Trois-Rivieres
Abstract :
A system approach is outlined and applied to electrical measurements. The essential idea of the system approach to electrical measurements is uniform treatment of measurement problems and/or instruments, which can be considered as special cases of a system whose functions are performed via signal processing. The notions of measuring system, its calibration and measurand reconstruction are interpreted on the basis of this approach. A design methodology and selected problems of applying VLSI technology to measuring system design are discussed
Keywords :
VLSI; calibration; measurement theory; signal processing; VLSI technology; calibration; design methodology; electrical measurements; measurand reconstruction; system design; Biomedical signal processing; Electric variables measurement; Information systems; Instruments; Manufacturing processes; Microelectronics; Particle measurements; Signal processing; Signal processing algorithms; Very large scale integration;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382610
