Title :
Camera Module Design, Assembly and Test Challenges
Author :
Luan, Jing-En ; Baraton, Xavier ; Wong, Wingshenq ; Goh, Kim-yong ; Yap, Daniel
Author_Institution :
Corp. Packaging, Eng. & Autom., Asia Pac, STMicroelectronics Pte Ltd., Singapore, Singapore
Abstract :
With the fast growth of mobile phone market, image sensor and camera module production have skyrocketed in recent years. Semiconductor industry has been put a lot of effort in camera module design, assembly, and test technologies. The technology platform was mainly developed from normal BGA platform. However, camera module is more complex than normal BGA in design, assembly, and test. There were special issues to be taken into consideration. In this paper, challenges of camera module design, assembly and test are discussed. Integrated analysis methodology was addressed for camera module design. Through the analysis of optical and mechanical tilt, module flexibility, loading force during test, reliability test, etc, it is clearly stated that design for assembly, design for test, and design for reliability are very important to create a higher yield product. Integrating theoretical analysis, numerical modeling, and physical test can help to have a fast solution and significantly reduce time to market and time to volume.
Keywords :
cameras; reliability; testing; assembly; camera module; design; loading force; mechanical tilt; module flexibility; reliability; testing; Assembly; Cameras; Electronics industry; Image sensors; Mobile handsets; Numerical models; Optical design; Optical sensors; Production; Semiconductor device testing;
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
DOI :
10.1109/EPTC.2008.4763509