Title :
Multifrequency binary measurement using frequency shift keyed symbols
Author :
Henderson, Ian A. ; McGhee, Jcseph ; Al Muhaisni, Musaed
Author_Institution :
Dept. of Electron. & Electr. Eng., Strathclydeuniv., Glasgow, UK
Abstract :
A new approach to designing signals for multifrequency binary testing (MBT) depends on digital modulation, which uses shift keyed symbols. This allows a variety of ways in which the binary energy may be concentrated in arrays of dominant harmonics. Phase shift keyed (PSK) signals have been previously shown to give narrowband detail with a high spectral resolution. Frequency shift keyed (FSK) symbols with the aid of harmonic arrays are designed to obtain wideband frequency information. The power is concentrated in a lower and a higher harmonic array whose spacing may be adjusted by a wideband factor. New designs, which have both wideband and narrowband detail, are obtained by combining PSK and FSK symbols
Keywords :
frequency shift keying; harmonic analysis; identification; phase shift keying; signal processing; FSK; PSK; arrays; binary energy; digital modulation; dominant harmonics; frequency shift keyed symbols; harmonic arrays; multifrequency binary testing; narrowband; phase shift keyed symbols; wideband; wideband frequency information; Digital modulation; Energy resolution; Frequency measurement; Frequency shift keying; Narrowband; Phase shift keying; Signal design; Signal resolution; Testing; Wideband;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382618