• DocumentCode
    2519194
  • Title

    Multifrequency binary measurement using frequency shift keyed symbols

  • Author

    Henderson, Ian A. ; McGhee, Jcseph ; Al Muhaisni, Musaed

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Strathclydeuniv., Glasgow, UK
  • fYear
    1993
  • fDate
    18-20 May 1993
  • Firstpage
    360
  • Lastpage
    365
  • Abstract
    A new approach to designing signals for multifrequency binary testing (MBT) depends on digital modulation, which uses shift keyed symbols. This allows a variety of ways in which the binary energy may be concentrated in arrays of dominant harmonics. Phase shift keyed (PSK) signals have been previously shown to give narrowband detail with a high spectral resolution. Frequency shift keyed (FSK) symbols with the aid of harmonic arrays are designed to obtain wideband frequency information. The power is concentrated in a lower and a higher harmonic array whose spacing may be adjusted by a wideband factor. New designs, which have both wideband and narrowband detail, are obtained by combining PSK and FSK symbols
  • Keywords
    frequency shift keying; harmonic analysis; identification; phase shift keying; signal processing; FSK; PSK; arrays; binary energy; digital modulation; dominant harmonics; frequency shift keyed symbols; harmonic arrays; multifrequency binary testing; narrowband; phase shift keyed symbols; wideband; wideband frequency information; Digital modulation; Energy resolution; Frequency measurement; Frequency shift keying; Narrowband; Phase shift keying; Signal design; Signal resolution; Testing; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
  • Conference_Location
    Irvine, CA
  • Print_ISBN
    0-7803-1229-5
  • Type

    conf

  • DOI
    10.1109/IMTC.1993.382618
  • Filename
    382618