• DocumentCode
    2519242
  • Title

    Influence of duty cycle on near-field diffraction of high-density gratings

  • Author

    Hu, Anduo ; Zhou, Changhe ; Wang, Shaoqing ; Ma, Jianyong ; Jia, Wei

  • Author_Institution
    Shanghai Inst. of Opt. & Fine Mech., Chinese Acad. of Sci., Shanghai, China
  • fYear
    2010
  • fDate
    3-6 Dec. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Near-field intensity distributions of high-density amplitude gratings with period d=2.3λ and different duty cycles illuminated by TE and TM polarized waves are simulated by using the finite-difference time-domain method. Numerical results show that intensity distributions of in the grooves change differently when duty cycle varies for TE and TM polarizations. As duty cycle increases, peak intensity in the middle of the first bright stripes and its locations change obviously. The main reason of location variation of the first bright stripes is the variation of the phase difference between the ±2nd orders and the 0th order, which is verified by using rigorous coupled-wave analysis. The investigation of influence of duty cycle on near-field diffraction of high-density gratings should be helpful for practical applications of high-density gratings.
  • Keywords
    diffraction gratings; finite difference time-domain analysis; light diffraction; light polarisation; TE polarized waves; TM polarized waves; duty cycle; finite-difference time-domain method; high-density gratings; near-field diffraction; near-field intensity distributions; phase difference; rigorous coupled-wave analysis; Diffraction; Diffraction gratings; Finite difference methods; Gratings; Image reconstruction; Optimized production technology; Time domain analysis; component; diffraction optics; duty cycle; high-density gratings; near-field diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-8393-8
  • Electronic_ISBN
    978-1-4244-8392-1
  • Type

    conf

  • DOI
    10.1109/AOM.2010.5713563
  • Filename
    5713563