Title :
A PC-base method for testing the dynamic performance of ultrahigh speed ADCs
Author :
Ming, Gao Xiao ; Ming, Li Chun ; He, Sun Sheng
Author_Institution :
Harbin Inst. of Technol., China
Abstract :
The authors present a testing method by designing a fast-in and slow-out memory system. They use the bispectrum to test the harmonic distortion of ultrahigh-speed analog-to-digital converters. The result shows that this method has the advantages of low cost and high detection resolution
Keywords :
Fourier transforms; automatic test equipment; electronic equipment testing; harmonic analysis; harmonic distortion; microcomputer applications; spectral analysis; analog-to-digital converters; bispectrum; dynamic performance; fast in memory; harmonic distortion; slow-out memory system; ultrahigh speed ADCs; Circuit testing; Clocks; Design methodology; Harmonic analysis; Harmonic distortion; Sampling methods; Signal analysis; Signal generators; System testing; Total harmonic distortion;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382634
