Title :
Tunable CMOS resistor circuit with improved linearity based on the arithmetical mean computation
Author_Institution :
Fac. of Electron., Telecommun. & Inf. Technol., Univ. Politeh. of Bucharest, Bucharest, Romania
Abstract :
An original active resistor structure using exclusively MOS devices working in the saturation region will be further presented. Performing the great advantage of an excellent linearity, obtained by a proper biasing of the differential core (using original translation and arithmetical mean blocks), the proposed circuit is designed for low-voltage low-power operation and allows a very good controllability of the equivalent resistance. The estimated linearity is obtained for an extended range of the differential input voltage and in the worst case of considering second-order effects that affect MOS transistors operation. The frequency response of the new active resistor is strongly increased by operating all MOS devices in the saturation region. The circuit is implemented in 0.35 μm CMOS technology on a die area of 30 μm × 40 μm, being supplied at ± 3.6 V . The active resistor presents a very good linearity (THD <; 0.8%) for an extended range of the input voltage ( - 2.5 V <; VX - VY <; 2.5 V). The tuning range is extremely large comparing with the previous reported active resistors: ± (500 kO - 5 MΩ) , the circuit being able to simulate both positive and negative active resistances.
Keywords :
CMOS integrated circuits; MIS devices; circuit tuning; low-power electronics; resistors; MOS device; active resistor structure; arithmetical mean computation; low-voltage low-power operation; tunable CMOS resistor circuit; tuning range; CMOS technology; Circuit optimization; Controllability; Frequency response; Linearity; MOS devices; MOSFETs; Resistors; Tunable circuits and devices; Voltage; Linearity; differential amplifier; equivalent active resistance; second-order effects;
Conference_Titel :
MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
Conference_Location :
Valletta
Print_ISBN :
978-1-4244-5793-9
DOI :
10.1109/MELCON.2010.5476005