Title :
Nonlinear disturbance errors in system identification using multisine test signals
Author :
Evans, Ceri ; Rees, David ; Jones, Lee
Author_Institution :
Dept. of Electron. & IT, Glamorgan Univ., UK
Abstract :
The errors introduced into linear system identification by nonlinear distortions are examined. A theoretical framework is presented for the distortion generated by odd power nonlinearities when using multisine test signals for frequency domain identification. It is shown that the distortion is a function of the number of test harmonics, their harmonic values and their phases. An explanation of previously published practical results is then given. This leads to the definition of a novel class of signals, termed no interharmonic distortion (NID) multisines, with interesting properties. The application of NID multisines to system testing with a recently proposed method of compensating for nonlinearities is examined. This allows the identification of the linear system and the straightforward calculation of the coefficient of the nonlinear term
Keywords :
electric distortion; error analysis; error compensation; frequency-domain analysis; harmonic analysis; identification; linear systems; measurement errors; measurement theory; signal processing; testing; compensation; frequency domain identification; harmonic values; interharmonic distortion; linear system identification; multisine test signals; nonlinear distortions; odd power nonlinearities; system testing; test harmonics; Frequency domain analysis; Harmonic distortion; Linear systems; Nonlinear distortion; Phase distortion; Power generation; Signal generators; Signal processing; System identification; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382639