Title :
On automating self-checking resistive ratios
Author :
Tsao, S. Hoi ; Chen, Gene C C
Author_Institution :
Nat. Meas. Lab., Hsinchu, Taiwan
Abstract :
Summary form only given. The authors consider the process of automating traditional self-checking resistive-ratio networks for instrumentation applications. During the replacement of the manual high-quality connections with relays and solid-state switches, they examine practical as well as novel means of reducing connection resistances, and, more importantly, their effect on the uncertainty of the realized ratio
Keywords :
automatic testing; built-in self test; electric resistance measurement; measurement errors; measurement standards; connection resistances; electrical standards; instrumentation applications; manual high-quality connections; relays; self-checking resistive ratios; solid-state switches; traditional self-checking resistive-ratio networks; uncertainty; Connectors; Electrical resistance measurement; Instruments; Laboratories; Relays; Resistors; Solid state circuits; Switches; Uncertainty; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382649