Title :
Ambiguity function used for detection of confocal microscope
Author :
Huang, Xiangdong ; Tan, Jiubin ; Zhu, Jiaxing
Author_Institution :
Center of Ultra-Precision Optoelectron. Instrum., Harbin Inst. of Technol., Harbin, China
Abstract :
In the conventional confocal microscope, the alignment of physical pinholes is an important problem. In this paper, a digital pinhole filter based on image restoration is investigated for the confocal microscope. Firstly, we discuss the properties of ambiguity function. Next, we use it to build the off-focus point spread function (PSF). Then, we use image restoration technique based on inverse filtering method to reject out-of-focus light in order to improve the depth resolution. Experimental results indicate that the method can reduce the pixel crosstalk resulting from out-of-focus light, and the alignment of pinholes can be made easy.
Keywords :
digital filters; image resolution; image restoration; optical crosstalk; optical filters; optical microscopy; optical transfer function; ambiguity function; confocal microscope; depth resolution; digital pinhole filter; image restoration; inverse filtering method; off-focus point spread function; out-of-focus light; pinholes alignment; pixel crosstalk; Adaptive optics; Image restoration; Microscopy; Optical filters; Optical imaging; Optical scattering; Wiener filter; Virtual pinhole; confocal; digital pinhole; out-of-focus light;
Conference_Titel :
Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4244-8393-8
Electronic_ISBN :
978-1-4244-8392-1
DOI :
10.1109/AOM.2010.5713594